One-Sided Sensor: Raytek Releases Infrared Imaging System For Low-Emissivity Glass

By design, Low-E glass has very low emissivity (high reflection), which presents a significant challenge to the process engineer. Simply scanning from the topside of the glass will provide erroneous readings, as the correct emissivity will not be factored into the temperature determination. With the addition of an IR point sensor to measure the temperature on the uncoated side of the glass where the emissivity is both known and significantly higher, the Raytek GS110 can automatically correct the thermal image and provide a more accurate result.



By quickly detecting thermal irregularities within the glass and identifying defective heating elements, the Raytek GS110 allows glass processors to improve product quality and uniformity, and to reduce scrap. If a fault or defect occurs, an alarm is triggered to allow for corrective action. Further, the Raytek GS110 system allows the user to set-up predefined recipes to accommodate frequent product changes involving glass parts of differing size, thickness and coating typical in glass processes.



The GS110 incorporates all of the features of the proven Raytek GS100 System and can therefore be used for non-contact infrared temperature measurement in other secondary glass-processing applications such as bending, forming, and annealing. The new system features an automatic correction mode that adjusts the system to accommodate changes in emissivity due to different glass types or coatings, a first in the industry, and is the only system on the market that provides accurate two-dimensional thermal images of low-emissivity glass.



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